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- reflectance
SEMI-AUTO REFLECTANCE MEASUREMENT SYSTEM
- This semi-automatic reflectance measurement system captures complete spectral and colorimetric properties at 0° to 75° angle of incidence simultaneously for coated glass, polished substrates, or diffuse surfaces without requiring second-surface masking. Substrates as thin as 400 µm can be tested with typical scan times of 300ms per point scan.
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