reflectance

  • REFLECTANCE MEASUREMENT HEADS Quick View
    • REFLECTANCE MEASUREMENT HEADS Quick View

    • REFLECTANCE MEASUREMENT HEADS

    • The models are available in fixed angle of incidence configurations ranging from 10° to 75°. A handheld unit with a variable angle of incidence is also available. They are capable of first surface or total specular reflection on glass, plastic, metal, or polished substrates and can be used with sample sizes as thin as 400µm. The spectral range is from…
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  • ROTARY REFLECTANCE MEASUREMENT SYSTEM Quick View
    • ROTARY REFLECTANCE MEASUREMENT SYSTEM Quick View

    • ROTARY REFLECTANCE MEASUREMENT SYSTEM

    • This fully automatic gonio-reflectance measurement system captures complete spectral and colorimetric properties simultaneously at 0° and 45° angle of incidence for coated glass, polished substrates, or diffuse surfaces without requiring second-surface masking. Substrates as thin as 400 µm can be tested with typical scan times of 300 msec per measurement point.
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  • SEMI-AUTO REFLECTANCE MEASUREMENT SYSTEM Quick View
    • SEMI-AUTO REFLECTANCE MEASUREMENT SYSTEM Quick View

    • SEMI-AUTO REFLECTANCE MEASUREMENT SYSTEM

    • This semi-automatic reflectance measurement system captures complete spectral and colorimetric properties at 0° to 75° angle of incidence simultaneously for coated glass, polished substrates, or diffuse surfaces without requiring second-surface masking. Substrates as thin as 400 µm can be tested with typical scan times of 300ms per point scan.
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