reflectance

  • REFLECTANCE MEASUREMENT HEADS Quick View
    • REFLECTANCE MEASUREMENT HEADS Quick View
    • REFLECTANCE MEASUREMENT HEADS
    • Rated 0 out of 5
    • The models are available in fixed angle of incidence configurations ranging from 0° to 45°. A handheld unit with a variable angle of incidence is also available. They are capable of first surface or total specular reflection on glass, plastic, metal, or polished substrates and can be used with sample sizes as thin as 0.15 mm. The spectral range is…
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  • ROTARY REFLECTANCE MEASUREMENT SYSTEM Quick View
    • ROTARY REFLECTANCE MEASUREMENT SYSTEM Quick View
    • ROTARY REFLECTANCE MEASUREMENT SYSTEM
    • Rated 0 out of 5
    • This fully automatic gonio-reflectance measurement system captures complete spectral and colorimetric properties simultaneously at 0° and 45° angle of incidence for coated glass, polished substrates, or diffuse surfaces without requiring second-surface masking. Substrates as thin as 500 µm can be tested with typical scan times of 200 msec per measurement point.
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  • SEMI-AUTO REFLECTANCE MEASUREMENT SYSTEM Quick View
    • SEMI-AUTO REFLECTANCE MEASUREMENT SYSTEM Quick View
    • SEMI-AUTO REFLECTANCE MEASUREMENT SYSTEM
    • Rated 0 out of 5
    • This semi-automatic reflectance measurement system captures complete spectral and colorimetric properties at 0° and 45° angle of incidence simultaneously for coated glass, polished substrates, or diffuse surfaces without requiring second-surface masking. Substrates as thin as 500 µm can be tested with typical scan times of 200 msec per measurement point.
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