This semi-automatic gonio-reflectance measurement system automatically captures complete spectral & colorimetric properties at 0° to 75° angle of incidence simultaneously, for coated glass, polished substrates or diffuse surfaces without requiring second-surface masking. Substrates as thin as 400 µm can be tested with typical scan times of 300ms per point scan time.
Based on high precision spectroradiometric instrumentation, proprietary measurement techniques and expertise in low-light measurement technology developed by Gamma Scientific, the product range features industry-leading accuracy, repeatability and throughput, including both refractive index determination and thin film coating thickness.
Applications
- Anti-reflectance coating characterization
- Flat-panel display glass testing
- Touchscreen display glass testing
- Optical filter / lens testing
- Pyrolytic glass coating test & characterization
- Characterization of flat panel displays, photovoltaic coatings, low-E architectural coatings, paint samples and diffuse plastics
Highly Accurate & Repeatable Reflection Measurements
- Nondestructively capture complete spectral and colorimetric properties with scan times as short as 200 msec per measurement point
- Isolated first-surface measurement of thin glass substrates down to 500 µm in thickness without requiring second-surface masking
- Measure total reflectance or isolate internal optical interfaces
- Test capability for diffuse or specular surfaces
- Programmable, multi-location measurement, pass/fail criteria settings and binning capabilities
- Configuration options including handheld, semi-automatic and fully automatic rotary systems with robotic loading
In addition to our exceptional technical and functional capabilities, Gamma Scientific is ISO/IEC 17025 accredited by NVLAP (NVLAP lab code 200823-0).
| Optical Specifications | ||
191 Optical Head (Optional Geometries of 0° and 20°) | 10 Degree Angle of Incidence | 45 Degree Angle of Incidence |
| Measurement Time | First surface specular reflection | First surface specular reflection |
| Illumination Angle | 10° | 45° |
| Viewing Angle | 10° | 45° |
Maximum Sample Thickness (first-surface reflectance only) | 0.4mm (10 deg) | 0.25mm (45 deg) |
| Maximum Sample Thickness | 6 mm | 6 mm |
| Maximum Sample Size | 400 mm x 350 mm | 400 mm x 350 mm |
| Spectral Range | 380 to 940nm | 380 to 940nm |
| Illumination Spot Size (sample area) | 1 mm x 10 µm | 1 mm x 10 µm |
| Calibration Reference Standard | Integral BK-7 polished glass | Integral BK-7 polished glass |
| Spectral Reflectance | ± 0.05% | ± 0.05% |
| Tristimulus (CIE 1931 X,Y,Z) | ± 0.05 | ± 0.10 |
| Chromaticity (CIE 1931 x,y) | ± 0.003 | ± 0.003 |
| LAB Color (CIE 1976 L*, a*, b*) | L ± 0.3, a* ± 0.2, b* ± 0.2 | L ± 0.3, a* ± 0.2, b* ± 0.2 |
| System Specifications | ||
| 191 Optical Head | 191F-1045 Dual Angle Optics | |
Measurement Program Types (all measured @ 10° & 45° simultaneously) | 5 selectable program types, individually configurable for up to 10 different panel sizes: 40-point grid; 25-point grid; 5-point cross, 3-point diagonal; single-point | |
| Measurement Locations | Position coordinates can be individually set for 10 panel sizes with 1 mm resolution Default grid 10 mm from each edge with equal settings between corner locations | |
| Cycle Time | Program dependent, each measurement point approximately 1500 msec | |
| Spectral Data | Reflectance as a function of wavelength | |
| Colorimetric Data | Tristimulus 1931 X,Y,Z Tristimulus 1964 X,Y,Z CIE 1931 x,y CIE 1976 L*, a*, b* CIE 1976 L*, u*, v* | |
| System Dimensions | 1.25 meters H x 1.0 meters W x 1.0 meters D Weight 300 kg | |
| Operating Ranges | Ambient Temperature 0 to 35°C Relative Humidity < 90% non-condensing | |
| Specifications are subject to change without notice. | ||
- 191F-1045 Dual Angle Gonioreflectometer Head, Configured for 10deg and 45deg Specular Inspection, Integrated Focus Adjustment with Laser Distance Sensor and Z Height Feedback, Halogen Source, 380-830nm Spectral Range.
- GS-1220-1-RM Spectroradiometric measurement system (360-900 nm) with 2-meter fiber-optic probe, C342USB Interface, Rack Mountable
- System controller – rack mount computer preconfigured with Gamma Scientific AR measurement software
- RS-4-3-1667 precision lamp constant current power supply
- On-site install; up to 2 Days of installation and training, includes travel expenses
