This semi-automatic gonio-reflectance measurement system automatically captures complete spectral & colorimetric properties at 0° to 45° angle of incidence simultaneously, for coated glass, polished substrates or diffuse surfaces without requiring second-surface masking. Substrates as thin as 400 µm can be tested with typical scan times of 500ms per point scan time. User programmable for multi-location measurements.
Based on high precision spectroradiometric instrumentation, proprietary measurement techniques and expertise in low-light measurement technology developed by Gamma Scientific, the product range features industry-leading accuracy, repeatability and throughput, including both refractive index determination and thin film coating thickness.
Applications
- Anti-reflectance coating characterization
- Flat-panel display glass testing
- Touchscreen display glass testing
- Optical filter / lens testing
- Pyrolytic glass coating test & characterization
- Characterization of flat panel displays, photovoltaic coatings, low-E architectural coatings, paint samples and diffuse plastics
Highly Accurate & Repeatable Reflection Measurements
- Nondestructively capture complete spectral and colorimetric properties with scan times as short as 200 msec per measurement point
- Isolated first-surface measurement of thin glass substrates down to 400 µm in thickness without requiring second-surface masking
- Measure total reflectance or isolate internal optical interfaces
- Test capability for diffuse or specular surfaces
- Programmable, multi-location measurement, pass/fail criteria settings and binning capabilities
- Configuration options including handheld, semi-automatic and fully automatic rotary systems with robotic loading
- Other reflectance measurement heads are available separately in fixed angle of incidence configurations ranging from 10° to 75°.
In addition to our exceptional technical and functional capabilities, Gamma Scientific is ISO/IEC 17025 accredited by NVLAP (NVLAP lab code 200823-0).
| Optical Specifications | ||
191 Optical Head (Optional Geometries of 0° and 20°) | 10 Degree Angle of Incidence | 45 Degree Angle of Incidence |
| Measurement Time | First surface specular reflection | First surface specular reflection |
| Illumination Angle | 10° | 45° |
| Viewing Angle | 10° | 45° |
Maximum Sample Thickness (first-surface reflectance only) | 0.4mm (10 deg) | 0.25mm (45 deg) |
| Maximum Sample Thickness | 6 mm | 6 mm |
| Maximum Sample Size | 400 mm x 350 mm | 400 mm x 350 mm |
| Spectral Range | 380 to 940nm | 380 to 940nm |
| Illumination Spot Size (sample area) | 1 mm x 10 µm | 1 mm x 10 µm |
| Calibration Reference Standard | Integral BK-7 polished glass | Integral BK-7 polished glass |
| Spectral Reflectance | ± 0.05% | ± 0.05% |
| Tristimulus (CIE 1931 X,Y,Z) | ± 0.05 | ± 0.10 |
| Chromaticity (CIE 1931 x,y) | ± 0.003 | ± 0.003 |
| LAB Color (CIE 1976 L*, a*, b*) | L ± 0.3, a* ± 0.2, b* ± 0.2 | L ± 0.3, a* ± 0.2, b* ± 0.2 |
| System Specifications | ||
| 191 Optical Head | 191F-1045 Dual Angle Optics | |
Measurement Program Types (all measured @ 10° & 45° simultaneously) | 5 selectable program types, individually configurable for up to 10 different panel sizes: 40-point grid; 25-point grid; 5-point cross, 3-point diagonal; single-point | |
| Measurement Locations | Position coordinates can be individually set for 10 panel sizes with 1 mm resolution Default grid 10 mm from each edge with equal settings between corner locations | |
| Cycle Time | Program dependent, each measurement point approximately 1500 msec | |
| Spectral Data | Reflectance as a function of wavelength | |
| Colorimetric Data | Tristimulus 1931 X,Y,Z Tristimulus 1964 X,Y,Z CIE 1931 x,y CIE 1976 L*, a*, b* CIE 1976 L*, u*, v* | |
| System Dimensions | 1.25 meters H x 1.0 meters W x 1.0 meters D Weight 300 kg | |
| Operating Ranges | Ambient Temperature 0 to 35°C Relative Humidity < 90% non-condensing | |
| Specifications are subject to change without notice. | ||
- 191F-1045 Dual Angle Gonioreflectometer Head, Configured for 10deg and 45deg Specular Inspection, Integrated Focus Adjustment with Laser Distance Sensor and Z Height Feedback, 380-830nm Spectral Range.
- RadOMA Spectroradiometric measurement system (380-900 nm) with 2 meter fiber optic probe
- 0.5m X-Y stages for testing large range of samples sizes, and thickness. includes dark enclosure
- GS-1220-1-RM Spectroradiometric measurement system (360-900 nm) with 2-meter fiber-optic probe, C342USB Interface, Rack Mountable
- System controller – rack mount computer preconfigured with Gamma Scientific AR measurement software
- RS-4-3-1667 precision lamp constant current power supply
