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- SpectralLED, Uncategorized
- RS-7-4 WAFER PROBE ILLUMINATOR
- Designed to be adapted to test head manipulators and handler instrumentation for wafer-level CCD and CMOS sensor test and calibration.
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- SpectralLED, Uncategorized
- RS-7-6 WIDE FIELD OF VIEW
- Ideally suited for applications requiring a field of view up to 180°. The unique optical design delivers equal radiance over the entire field, with better than 95% uniformity over the entire 180° field of view, the performance is unmatched in the industry.
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- SpectralLED, Uncategorized
- RS-7-7 LIGHT BOOTH
- Simulates virtually infinite lighting conditions enabling visual color assessment for photography, product display or lighting design applications. Both real and theoretical lighting conditions can be produced, enabling CRI experimentation, analysis and optimization.
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- SpectralLED, Uncategorized
- RS-7-940 SWIR UNIFORM LIGHT SOURCE
- Incorporates 16 discrete LED devices, all with a center wavelength of 940 nm. The output is directly coupled into a 38mm diameter homogenizing rod, with a length of 190 mm, having a diffuser optically bonded to the output surface.
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- reflectance
- SEMI-AUTO REFLECTANCE MEASUREMENT SYSTEM
- This semi-automatic reflectance measurement system captures complete spectral and colorimetric properties at 0° and 45° angle of incidence simultaneously for coated glass, polished substrates, or diffuse surfaces without requiring second-surface masking. Substrates as thin as 500 µm can be tested with typical scan times of 200 msec per measurement point.
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