CUSTOMIZABLE SOLUTIONS FOR REFLECTANCE MEASUREMENT APPLICATIONS

Reflectance testing for advanced display technologies, architectural or automotive glass, near-eye displays (AR/VR/MR), and heads-up displays.

At the core of our modular reflectance measurement system is Gamma Scientific’s Gonioreflectometer Head, which uniquely isolates and separates reflection from the first and second surface samples into two beams. Our state-of-the-art spectrometers and Gamma Scientific’s Anti Reflectance Measurement software capture thin film coatings’ complete spectral and colorimetric properties, with rapid scan times typically under one second. Our product range features industry-leading accuracy, repeatability, and throughput, including both refractive index determination and thin film coating thickness.

Our reflectance measurement solutions can be customized to include benchtop transmission, semi-automatic gonioreflectance, and fully automatic measurement systems. We offer on-site installation and training support.

REFLECTANCE MEASUREMENT HEADS

The models are available in fixed angle of incidence configurations ranging from 0° to 45°. A handheld unit with a variable angle of incidence is also available. They are capable of first surface or total specular reflection on glass, plastic, metal, or polished substrates and can be used with sample sizes as thin as 0.15 mm. The spectral range is from 365 nm to 100 nm.

ROTARY REFLECTANCE MEASUREMENT SYSTEM

This fully automatic gonio-reflectance measurement system captures complete spectral and colorimetric properties simultaneously at 0° and 45° angle of incidence for coated glass, polished substrates, or diffuse surfaces without requiring second-surface masking. Substrates as thin as 500 µm can be tested with typical scan times of 200 msec per measurement point.

SEMI-AUTO REFLECTANCE MEASUREMENT SYSTEM

This semi-automatic reflectance measurement system captures complete spectral and colorimetric properties at 0° and 45° angle of incidence simultaneously for coated glass, polished substrates, or diffuse surfaces without requiring second-surface masking. Substrates as thin as 500 µm can be tested with typical scan times of 200 msec per measurement point.

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Gamma Scientific’s reflectance measurement solutions have been trusted by the leading glass coating and display manufacturers for over 50 years. Learn how we can tailor a reflectance measurement solution to your application.